In consideration of the presently available experience with several set ups constructed for research institutes and industrial companies, the following specifications can be expected (deuterium lamp with low operation time):
测量精度 透过率 <0.3% 反射率 <0.5% Transmittance out of bａnd <0.1% Scattered Reflectance >0.001% 157nm Reproducability 157nm Diffuse Reflectance <5% 157nm="" Scattered Reflectance <5% 157nm="" (@ aperture of 1mm in front of PMT , wavelength dependent
主要特点
The UV/VUV - spectrophotometer system is a product of more than twenty years of research in the field of production and testing of advanced optical components for UV/VUV spectral range. The current system is based on a prototype spectrophotometer of the Laser Zentrum Hannover e.V., which was initially developed for typical analytical tasks in optical thin film technology. During the production phase of more than ten units for industrial companies and research institutes, the measurement performance of the system could be improved to an outstanding level, which qualifies the spectrophotometer in routine quality management and research applications.
